The award-winning LumiSolarCell System utilizes the photoluminescence, electroluminescence, and infrared phenomena to image micro cracks, shunts, regions of low lifetime, inhomogeneities, hot spots or other cell failures of photovoltaic cells or wafers.
EL, PL and IR as contactless and therefore non-destructive methods are an indispensable tool for advanced solar research. In addition to that, the series resistance (Rs) can be measured by an algorithm which compares EL images taken under low and high current conditions. The knowledge gained will lead to increased product quality and yield.