OFDR是一種技術，利用掃頻光源和干涉儀來生成光學鏈路、路徑或組件的反射掃描或“映射”。這項技術可以實現極高解析度的空間反射測量。通過寬波長掃描範圍，該測量可以在標準光纖中實現5微米的點對點解析度，或在許多矽波導中接近3微米至4微米的解析度。

SENTEC SPA-100 Swept Photonics Analyzer WSS光纖故障定位儀 具有以下主要特點:

High Resolution

• 5um point-to-point resolution in fiber (160nm sweep)
• Close to 3um to 4um in silicon waveguide
• Ideal for SiPh and PIC analysis where every detail matters

Configurable

• Select the system that works for your application
• Tunable laser sweep range defines measurement range
• Compatible with Santec Line of TSLs
• 550, 570, 710, 770

Bidirectional Reflectance Measurement

• Dual ports act as inputs and outputs
• Measure reflectance in both directions
• Necessary for devices that have directionality (ie OPAs)

Wide WDL dynamic range

• Coherent detection allows for >70dB of dynamic range for
  swept loss measurements with no gain switching.

Automation Ready

• Feed through port in back allows for
  integration of external optical power meter
  for active alignment.

Proximity Sensing for SiPh alignment

• Use the fiber as a probe to sense distance
  to the silicon chip/wafer.
• Both ports available

Polarization maintaining fiber

• Polarization aligned to TE modes for easy
  coupling to waveguides
• No need to waste time aligning
  polarization to waveguide.

若您對於Santec – OFDR solution有任何興趣，請協助告訴我們，我們願意提供完整的產品及技術解決方案介紹。
聯絡信箱: gs12@globalsi.com.tw