ANTARES
Wafer Inspection, Crack Detection
代碼 Intego
人氣 1914
Microcrack detection is an important tool for wafer, cell and module production. With the new ANTARES system, a reliable tool for automatic detection of cracks in individual wafers and cells is available. The quality of the crack images is no longer degraded by grain boundaries or other structures, as it is often seen in electroluminescence (EL) or photoluminescence (PL) images.
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