The wafer measurement instrument offering the best available calibrated analysis of carrier recombination lifetime. Fully compliant with SEMI Standard PV-13.
WCT instruments showcase our unique measurement and analysis techniques, including the
SEMI Standard Quasi-Steady-State Photoconductance (QSSPC) lifetime measurement method
developed by Sinton Instruments in 1994.
The QSSPC technique is ideal for monitoring multicrystalline wafers, dopant diffusions, and
low-lifetime samples. This method complements the use of the transient photoconductance technique that is also standard on this instrument.
The QSSPC lifetime measurement also yields the implied open-circuit voltage (versus illumination)
curve, which is comparable to an I-V curve at each stage of a solar cell process.