Simple and accurate contactless measurement of true bulk lifetimes on as-grown or shaped silicon. Complies with SEMI Standard PV-13.
The BLS-I and BCT-400 measurement systems perform lifetime measurement on monocrystal-line or multicrystalline silicon (ingots or bricks) without requiring surface passivation.
Since lifetime measurments are among the most sensitive techniques for characterizing growth and contamination defects, these tools allow you to assess silicon quality directly after growth.
For the flexibility to measure all surface types (from 150-mm diameter to flat) choose the BLS-I. For a compact tool designed to measure only flat surfaces, choose the BCT-400.